Title :
Soldering-induced stress on junction-down-mounted ridge-waveguide laser diodes
Author :
Nomoto, E. ; Nakahara, K. ; Shimaoka, M.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
We demonstrate a novel way of evaluating thermal stress in junction-down-mounted ridge-waveguide laser diodes. Spatially resolved electroluminescence and photoluminescence observation revealed the localized stress that led to gradual degradation during aging.
Keywords :
ageing; electroluminescence; photoluminescence; ridge waveguides; semiconductor lasers; soldering; thermal stresses; waveguide lasers; aging; electroluminescence; gradual degradation; junction-down-mounted ridge-waveguide laser diode; localized stress; photoluminescence; soldering; spatially resolving; thermal stress; Aging; Capacitive sensors; Degradation; Diode lasers; Electroluminescence; Laboratories; Optical waveguides; Spatial resolution; Thermal stresses; Waveguide junctions;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
DOI :
10.1109/CLEOPR.2003.1274577
