DocumentCode
405349
Title
Soldering-induced stress on junction-down-mounted ridge-waveguide laser diodes
Author
Nomoto, E. ; Nakahara, K. ; Shimaoka, M.
Author_Institution
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume
1
fYear
2003
fDate
15-19 Dec. 2003
Abstract
We demonstrate a novel way of evaluating thermal stress in junction-down-mounted ridge-waveguide laser diodes. Spatially resolved electroluminescence and photoluminescence observation revealed the localized stress that led to gradual degradation during aging.
Keywords
ageing; electroluminescence; photoluminescence; ridge waveguides; semiconductor lasers; soldering; thermal stresses; waveguide lasers; aging; electroluminescence; gradual degradation; junction-down-mounted ridge-waveguide laser diode; localized stress; photoluminescence; soldering; spatially resolving; thermal stress; Aging; Capacitive sensors; Degradation; Diode lasers; Electroluminescence; Laboratories; Optical waveguides; Spatial resolution; Thermal stresses; Waveguide junctions;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN
0-7803-7766-4
Type
conf
DOI
10.1109/CLEOPR.2003.1274577
Filename
1274577
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