Title :
Large phase shift Z-scan analysis for thick Kerr medium
Author :
Kwak, C.H. ; Lee, S.J. ; Lee, Y.L.
Author_Institution :
Dept. of Phys., Yeungnam Univ., Kyongsan, South Korea
Abstract :
We developed a large phase shift-thick sample Z-scan theory, which is applicable to a range of sample thickness from thin sample limit to the thick sample regime and all the range of nonlinear phase shifts.
Keywords :
nonlinear optics; optical materials; Kerr medium; Z-scan theory; nonlinear phase shift; thick sample; Apertures; Iron; Laser beams; Laser theory; Nonlinear optics; Optical propagation; Partial differential equations; Photonics; Physics; Polarization;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
DOI :
10.1109/CLEOPR.2003.1274707
