Incoherent interferometric measurement technique for PLC devices

Author

Wei Chen ; Wang, Zhipeng ; Chen, Yung J.

Author_Institution

Maryland Univ., Baltimore, MD, USA

Volume

1

fYear

2003

fDate

15-19 Dec. 2003

Abstract

As an effective way of characterizing PLC devices, the incoherent interferometric technique measures discrete optical paths through the device so that detailed device/material properties and fabrication errors can be isolated. The technique is effective not only for AWGs (feed forward filter), but also ring resonators (auto regressive filter). A single measurement yields both passband power spectrum and dispersion property of the device.

Keywords

arrayed waveguide gratings; feedforward; light interferometry; optical dispersion; optical filters; optical planar waveguides; optical resonators; optical variables measurement; AWG; PLC devices; auto regressive filter; device properties; discrete optical paths; dispersion property; fabrication errors; feed forward filter; incoherent interferometric measurement technique; material properties; passband power spectrum; ring resonators; Feeds; Material properties; Measurement techniques; Optical device fabrication; Optical devices; Optical filters; Optical interferometry; Optical ring resonators; Programmable control; Resonator filters;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on

Print_ISBN

0-7803-7766-4

Type

conf

DOI

10.1109/CLEOPR.2003.1274834

Filename

1274834