DocumentCode
405671
Title
Performances and reliability of 850 nm VCSELs with various offset in gain peak and Fabry-Perot dip
Author
Lai, Fang-I ; Laih, Li-Hong ; Hsueh, T.H. ; Tseng, S.P. ; Kuo, H.C. ; Wang, S.C.
Author_Institution
Inst. of Electro-Opt. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
2
fYear
2003
fDate
15-19 Dec. 2003
Abstract
The 850 nm VCSELs with various wavelength offsets in gain peak and Fabry-Perot dip were designed and fabricated. The VCSEL with 10 nm offset has the threshold current with less temperature sensitivity and the best reliability.
Keywords
Fabry-Perot resonators; laser cavity resonators; optical design techniques; optical fabrication; reliability; semiconductor lasers; surface emitting lasers; 850 nm; Fabry-Perot dip; VCSEL; gain peak offset; reliability; temperature sensitivity; threshold current; Electronics packaging; Fabry-Perot; Performance gain; Pulsed laser deposition; Resonance; Surface emitting lasers; Temperature dependence; Temperature sensors; Threshold current; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN
0-7803-7766-4
Type
conf
DOI
10.1109/CLEOPR.2003.1277058
Filename
1277058
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