A simple macromodeling approach for analysing substrate coupling in an RF mixer IC

A circuit level substrate coupling noise (SCN) macromodel approach is proposed and applied to the tested mixer to investigate the interference of SCN through the four case studies. The results of these studies reveal that SCN current pulse width δ_t, and the spacing distance d of the contacts are two key factors and impact the third-order input-referred intercept point (IIP3) of a receiver mixer of the RF SoC.