• DocumentCode
    405789
  • Title

    A algorithm of yield analysis based on kernel density estimate

  • Author

    Zhou Lei ; Sun Lingling ; Liu Jun

  • Author_Institution
    Microelectron. CAD Center, Hangzhou Inst. of Electron. Eng., China
  • Volume
    1
  • fYear
    2003
  • fDate
    21-24 Oct. 2003
  • Firstpage
    250
  • Abstract
    In this paper, a new yield analysis algorithm based on kernel density estimate is developed. With the new algorithm, we can obtain the result by dozens simulations on data of arbitrary model. It is more accurate and efficient than other traditional yield analysis method such as Monte Carlo approach. The test example shows that this algorithm has much practical value in yield analysis of IC design.
  • Keywords
    Monte Carlo methods; integrated circuit yield; probability; IC design; Monte Carlo method; integrated circuit design; kernel density estimate; yield analysis algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2003. Proceedings. 5th International Conference on
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7889-X
  • Type

    conf

  • DOI
    10.1109/ICASIC.2003.1277535
  • Filename
    1277535
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=405789