TESTLINE: an IEEE P1500 compatible test scheme for SoC test

An IEEE P1500 compatible test scheme, TESTLINE, for modular SoC testing is presented in this paper. The test scheme consists of wrappers, TAM and User Defined Controller (UDC). For a given SoC, with specified parameters of modules and their tests, TESTLINE can optimize the testing time for the whole SoC using Integer Linear Programming (ILP). The ILP can efficiently determine the width of TAM and the assignment of modules to TAM. Experimental results for the ´ITC´02 SOC Test Benchmarks´ show that TESTLINE is an effective and efficient test scheme for SoC testing.