Title :
Surface flashover across ceramic disks in vacuum at cryogenic temperatures
Author :
Keene, H. ; Dickens, J. ; Neuber, A. ; Krompholz, H.
Author_Institution :
Dept. of Electr. & Comput. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
Abstract :
As superconducting technology becomes more viable in the marketplace, especially in high power applications, the need for a well researched high thermal conductivity electrical insulator is needed. The electrical failure mode for these types of insulators is often surface flashover at subatmospheric temperature and pressure. Testing of two such insulators, aluminum nitride and aluminum oxide, for this failure mode is done for two differing electrode geometries. In addition three coats of GE 7031 dielectric varnish are applied to the exposed parts of the insulator for comparison testing with nonvarnished samples. In general the testing shows an increasing breakdown voltage trend with decreasing temperature. These results indicate a temperature related dependence of the secondary electron emission and electron induced outgassing, which is a component in the process of surface flashover. The addition of the varnish results in a lowered breakdown voltage. The research also covers the effect of electrode conditioning, and presents optical diagnostics of the gas species involved during breakdown.
Keywords :
aluminium compounds; ceramic insulators; flashover; high-temperature superconductors; low-temperature techniques; nitrogen compounds; thermal conductivity; vacuum breakdown; aluminum nitride; aluminum oxide; breakdown voltage; ceramic disks; cryogenic temperatures; dielectric varnish; electrical failure mode; electrical insulator; electrode geometry; high power applications; optical diagnostics; superconducting technology; surface flashover; thermal conductivity; vacuum; Aluminum nitride; Ceramics; Cryogenics; Dielectrics and electrical insulation; Electrodes; Electron emission; Flashover; Insulator testing; Temperature; Thermal conductivity;
Conference_Titel :
Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-7915-2
DOI :
10.1109/PPC.2003.1277716