• DocumentCode
    405930
  • Title

    A critical analysis of IGBT geometries, with the intention of mitigating undesirable destruction by fault scenarios of an adverse nature

  • Author

    Leyh, G.E.

  • Author_Institution
    SLAC, Menlo Park, CA, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    15-18 June 2003
  • Firstpage
    366
  • Abstract
    Megawatt class insulated gate bipolar transistors [IGBTs] find many uses in industrial applications such as traction drives, induction heating and power factor correction. At present, these devices are not optimized for higher speed pulsed-power applications, such as kicker magnets or klystron modulators. This paper identifies fundamental issues that limit the dI/dt performance of standard commercial packages, and investigates several IGBT design optimizations that significantly improve high-speed performance at high peak power levels. The paper presents design concepts, results of electromagnetic simulations, and performance data of actual prototypes under high dI/dt conditions.
  • Keywords
    induction heating; insulated gate bipolar transistors; power factor correction; prototypes; semiconductor device models; traction motor drives; IGBT; IGBT design optimization; electromagnetic simulation; induction heating; insulated gate bipolar transistor; kicker magnet; klystron modulator; power factor correction; prototype design; standard commercial package; traction drives; Design optimization; Geometry; Insulated gate bipolar transistors; Klystrons; Magnetic modulators; Magnets; Packaging; Power factor correction; Pulse modulation; Virtual prototyping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
  • Conference_Location
    Dallas, TX, USA
  • Print_ISBN
    0-7803-7915-2
  • Type

    conf

  • DOI
    10.1109/PPC.2003.1277730
  • Filename
    1277730