DocumentCode :
405930
Title :
A critical analysis of IGBT geometries, with the intention of mitigating undesirable destruction by fault scenarios of an adverse nature
Author :
Leyh, G.E.
Author_Institution :
SLAC, Menlo Park, CA, USA
Volume :
1
fYear :
2003
fDate :
15-18 June 2003
Firstpage :
366
Abstract :
Megawatt class insulated gate bipolar transistors [IGBTs] find many uses in industrial applications such as traction drives, induction heating and power factor correction. At present, these devices are not optimized for higher speed pulsed-power applications, such as kicker magnets or klystron modulators. This paper identifies fundamental issues that limit the dI/dt performance of standard commercial packages, and investigates several IGBT design optimizations that significantly improve high-speed performance at high peak power levels. The paper presents design concepts, results of electromagnetic simulations, and performance data of actual prototypes under high dI/dt conditions.
Keywords :
induction heating; insulated gate bipolar transistors; power factor correction; prototypes; semiconductor device models; traction motor drives; IGBT; IGBT design optimization; electromagnetic simulation; induction heating; insulated gate bipolar transistor; kicker magnet; klystron modulator; power factor correction; prototype design; standard commercial package; traction drives; Design optimization; Geometry; Insulated gate bipolar transistors; Klystrons; Magnetic modulators; Magnets; Packaging; Power factor correction; Pulse modulation; Virtual prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-7915-2
Type :
conf
DOI :
10.1109/PPC.2003.1277730
Filename :
1277730
Link To Document :
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