DocumentCode :
406063
Title :
CAD design of mask compensation patterns
Author :
Tellier, C.
Author_Institution :
LCEP, ENSMM, Besancon, France
Volume :
1
fYear :
2003
fDate :
22-24 Oct. 2003
Firstpage :
517
Abstract :
The wet micromachining of silicon mechanical structures for sensors is a widely used process. But compensation of the corner undercutting is frequently needed. Hence a new method to design compensation mask patterns is proposed here that is based on a numerical simulation. New results on the convex corner undercutting in anisotropic etching of (100), [110] and (hhl) silicon are presented for TMAH and KOH etchants. Simulations of the convex undercutting are performed using the simulator TENSOSIM. For this purpose new software applications are developed that allow us to work with more complex mask patterns. Compensating beams are then studied for various orientations. Differently shaped masks patterns are numerically tested (influence of shape, of relative dimensions and of misalignment of mask patterns) showing that the simulator TENSOSIM is a very convenient CAD tool to design compensation structures for convex corner micromachining in silicon.
Keywords :
circuit CAD; compensation; etching; masks; micromachining; CAD; KOH etchants; TENSOSIM; TMAH etchants; anisotropic etching; compensating beams; complex mask patterns; convex corner undercutting; design compensation; mask compensation patterns; numerical simulation; silicon mechanical structures; software applications; wet micromachining; Anisotropic magnetoresistance; Application software; Design automation; Design methodology; Etching; Mechanical sensors; Micromachining; Numerical simulation; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2003. Proceedings of IEEE
Print_ISBN :
0-7803-8133-5
Type :
conf
DOI :
10.1109/ICSENS.2003.1278992
Filename :
1278992
Link To Document :
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