• DocumentCode
    406428
  • Title

    Novel temperature based technique for measurement of endothelial dysfunction

  • Author

    Kharalkar, Nachiket ; Valvano, Jonathan W. ; Naghavi, Morteza ; Wei, Chia Ling

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    17-21 Sept. 2003
  • Firstpage
    308
  • Abstract
    The endothelial cells, which form the inner lining of the arteries, respond to changes in pressure by producing nitric oxide (NO) which in turn causes vasodilation. The normal functioning of the endothelium is hampered in certain cardiovascular diseases. Various methods have been developed to non-invasively determine the endothelial dysfunction (EDF). We propose to measure the EDF by causing reactive hyperemia in the arm and measuring the temperature variations of the hand region. We created reactive hyperemia by occluding the arm by blood pressure cuff at about 200 mmHg for 5 minutes, and then suddenly released the pressure. Using a computer-based data acquisition system, the temperature variations of the distal palmer pad/middle finger, during the entire procedure were continuously monitored. Initial studies have indicated that there is significant increase in the rate of rise as compared to rate off all of temperature (mean increase = 117%, standard deviation = 50%). Our goal is to non-invasively predict EDF from the temperature technique.
  • Keywords
    biomedical measurement; blood vessels; cellular biophysics; diseases; haemodynamics; patient diagnosis; 200 mmHg; 5 min; arteries; blood pressure cuff; cardiovascular diseases; computer-based data acquisition system; endothelial cells; endothelial dysfunction; endothelium; reactive hyperemia; vasodilation; Arteries; Atherosclerosis; Blood flow; Blood pressure; Cardiac arrest; Cardiac disease; Cardiovascular system; Cells (biology); Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-7789-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2003.1279623
  • Filename
    1279623