Title :
Probabilistic transformation of temporal information at individual synapses
Author :
Wang, Z. ; Xie, X. ; Song, D. ; Berger, T.W.
Author_Institution :
Program of Neurosci., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
The temporal structure of synaptic activation is critical to the induction of long-term synaptic plasticity. Experimentally, action potentials in presynaptic axons are reliably triggered by electric stimulation. The frequency of presynaptic input is the same as the stimulation frequency and is defined here as "input frequency". Upon arrival of presynaptic action potentials, transmitter release at individual synapses is probabilistic. We define the average frequency of transmitter release at individual synapses as "release frequency". Computer modeling has been widely used to simulate the input frequency-dependent elevation of calcium in dendritic spines, which is believed to trigger the induction of synaptic plasticity. In these models, input frequency has been used indiscriminately as release frequency to simulate synaptic events. Here, using both empirical and theoretical methods, we demonstrated that the release frequency is significantly smaller than the input frequency due to the probabilistic nature of transmitter release. We propose that this temporal transformation be taken into account in future synaptic plasticity models.
Keywords :
bioelectric potentials; calcium; neuromuscular stimulation; physiological models; probability; Ca; calcium; computer modeling; dendritic spine; electric stimulation; frequency-dependent elevation; individual synapses; long-term synaptic plasticity model; presynaptic action potential; presynaptic axons; probabilistic transformation; temporal information; temporal structure; Calcium; Computational modeling; Computer aided instruction; Discrete event simulation; Frequency; Hippocampus; Neurons; Neurotransmitters; Proteins; Transmitters;
Conference_Titel :
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
Print_ISBN :
0-7803-7789-3
DOI :
10.1109/IEMBS.2003.1279798