Title :
Pre-compensation for high-order aberrations of the human eye using on-screen image deconvolution
Author :
Alonso, M., Jr. ; Barreto, A.B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA
Abstract :
Some individuals with severe visual impairments may have difficulty in interacting with computers, even when using traditional means of visual correction (e.g., spectacles, contact lenses). This is, in part, because these correction mechanisms can only compensate for the most regular distortions or aberrations of the image in the eye. This paper proposes an image processing approach that will pre-compensate the images displayed on the computer screen, so as to counter the effect of the eye\´s aberrations on the image. The characterization of the eye required to perform this customized pre-compensation is the eye\´s Point Spread Function (PSF). The PSF can now be measured by a new generation of ophthalmic instruments generically called "Wavefront Analyzers." The characterization provided by these instruments also includes the "higher-order aberration components" and could, therefore, lead to a more comprehensive vision correction approach than traditional mechanisms. The methods presented here will be explained in terms of their theoretical foundation and illustrated with results from the correction of aberrations introduced by a lens with known and constant PSF.
Keywords :
bio-optics; deconvolution; eye; medical image processing; optical transfer function; vision defects; PSF; eye aberrations; high-order aberrations precompensation; higher-order aberration components; human eye; image processing approach; on-screen image deconvolution; ophthalmic instruments; point spread function; vision correction; visual correction; visual impairments; wavefront analyzers; Biomedical computing; Biomedical engineering; Deconvolution; Diffraction; Humans; Image processing; Instruments; Lenses; Retina; Vision defects;
Conference_Titel :
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
Print_ISBN :
0-7803-7789-3
DOI :
10.1109/IEMBS.2003.1279804