Title :
Functional brain imaging of speech perception via electrical stimulation
Author :
Tobey, E.A. ; Devous, M.D., Sr. ; Roland, P.S.
Author_Institution :
Callier Adv. Hearing Res. Center, Texas Univ., Dallas, TX, USA
Abstract :
In order to examine factors contributing to speech perception performance variations in cochlear implant users, single photon emission computed tomography (SPECT) was used to examine cortical activity (regional cerebral blood flow, rCBF) elicited by the electrical stimulation of multichannel cochlear implants. Normal hearing (N = 9) and cochlear implant (N = 8) subjects watched a 15 minute video-taped story under two conditions: audio presented monaurally to the left ear (implanted for cochlear implant subjects), and a visual only presentation. Left monaural stimulation in normal hearing subjects produced significant bilateral activation of Brodmann areas 41, 42, 22, 21, and 38. Cochlear implant subjects with relatively high levels of open-set speech perception demonstrated bilateral activation of cortex; however, the extent of activation was significantly less than that observed for normal hearing individuals, particularly in auditory association cortex (Brodmann areas 22, 21, 38). Individuals with minimal open set speech perception scores demonstrated unilateral activation of the cortex on the hemisphere contralateral to the ear of implantation, with minimal auditory association cortex activation.
Keywords :
blood flow measurement; brain; ear; hearing; hearing aids; medical image processing; neurophysiology; single photon emission computed tomography; speech; Brodmann areas; SPECT; cochlear implant users; cortical activity; electrical stimulation; functional brain imaging; regional cerebral blood flow; single photon emission computed tomography; speech perception; Auditory system; Biomedical imaging; Brain; Cochlear implants; Deafness; Electrical stimulation; Electrodes; Filters; Speech; Surgery;
Conference_Titel :
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
Print_ISBN :
0-7803-7789-3
DOI :
10.1109/IEMBS.2003.1280123