• DocumentCode
    406798
  • Title

    The high power and high frequency operation of the emitter turn-off (ETO) thyristor

  • Author

    Zhang, Bin ; Liu, Yunfeng ; Zhou, Xigen ; Hawley, Josh ; Huang, Alex Q.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., USA
  • Volume
    2
  • fYear
    2003
  • fDate
    2-6 Nov. 2003
  • Firstpage
    1167
  • Abstract
    This paper presents the high power and high frequency performance of the emitter turn-off thyristor (ETO). The homogenous switching due to the unity turn-off gain and high turn-off gate current rising rate enlarges the ETO´s SOA to full dynamic avalanche, approaching the physical limits of silicon. The short turn-off storage time, the high turn-on di/dt capability, low switching and conduction losses, and the low gate drive unit power consumption allow the ETO to operate at high power and high frequency (kHz range). Based on ETO´s switching loss, conduction loss, thermal impedance, and the system´s thermal dissipation, an ETO H-bridge voltage source converter´s output current and output power capabilities are calculated. An ETO based H-bridge converter is built, and 1000 Arms output current at 2000 V DC bus voltage and 1 kHz switching frequency is demonstrated.
  • Keywords
    bridge circuits; power consumption; power convertors; power transistors; 1 kHz; 1000 A; 2000 V; H-bridge voltage source converter; conduction loss; dynamic avalanche; emitter turn-off thyristor; gate drive unit power consumption; high frequency operation; high power operation; homogenous switching; thermal dissipation; thermal impedance; turn-off gate current rising rate; turn-off storage time; turn-on di/dt capability; unity turn-off gain; Energy consumption; Frequency; Impedance; Semiconductor optical amplifiers; Silicon; Switching converters; Switching loss; Thermal conductivity; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2003. IECON '03. The 29th Annual Conference of the IEEE
  • Print_ISBN
    0-7803-7906-3
  • Type

    conf

  • DOI
    10.1109/IECON.2003.1280218
  • Filename
    1280218