• DocumentCode
    406903
  • Title

    Applying approximate entropy and central tendency measure to analyze time series generated by schizophrenic patients

  • Author

    Hornero, R. ; Abasolo, D.E. ; Jimeno, N. ; Espino, P.

  • Author_Institution
    E.T.S. Ingenieros de Telecommunicacion, Valladolid Univ., Spain
  • Volume
    3
  • fYear
    2003
  • fDate
    17-21 Sept. 2003
  • Firstpage
    2447
  • Abstract
    The purpose of this study is the analysis of times series generated by 20 schizophrenic patients and 20 age-matched control subjects. We used two methods for quantifying the regularity and variability in the time series. These methods were the Approximate Entropy (ApEn), and a graphical representation by means of the second-order difference plots to estimate the Central Tendency Measure (CTM). Results showed that the degree of irregularity and variability of the time series generated by the schizophrenic patients were lower than time series generated by the control group. Thus, schizophrenic patients tended to generate more regular and rhythmic series than control subjects. There was a significant difference with the ANOVA procedure (p<0.001) between time series generated by both groups. These results were in agreement with findings that schizophrenic patients were characterized by less complex neurobehavioral measurements than normal subjects.
  • Keywords
    diseases; entropy; medical signal processing; patient monitoring; time series; ANOVA procedure; age-matched control subjects; approximate entropy; central tendency measure; neurobehavioral measurements; rhythmic series; schizophrenia; schizophrenic patients; second-order difference plots; time series regularity; time series variability; Analysis of variance; Entropy; Medical treatment; Mental disorders; Psychology; Rhythm; Telecommunication control; Testing; Time measurement; Time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-7789-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2003.1280411
  • Filename
    1280411