Title :
Predicting a key difference between the fragment beta-amyloid protein and its precursor with signal processing techniques
Author :
De Trad, C. Hejase
Author_Institution :
Dept. of Phys., United Arab Emirates Univ., Al-Ain, United Arab Emirates
Abstract :
To prevent amyloid plaque formation is to break the protein as soon as it is released from cells and before it aggregates to insoluble plaques. This might be accomplished by recognition of unusual features in the fragment that are missing in the precursor protein. The predicted RRM frequencies for beta-amyloid are: f=0.012±0.002 and f=0.254±0.018. The first frequency is characteristic of a functional group specific to the amyloid. The second frequency is compatible to some degree with the previous predicted frequency (f=0.293±0.016) for growth factors. It is anticipated that this characteristic frequency might be associated with a growth promoting function specific to beta-amyloid. Beta-amyloid precursor does not have this growth promoting frequency neither the specific amyloid frequency. On the other hand, both NGF and beta amyloid precursors have a common frequency (f=0.387±0.018 and 0.404±0.017) which is characteristic of neurotrophic growth factors and missing for beta amyloid protein. This predicted data supports experimental evidence that NGF could be used to protect neurons and brain cells against degeneration.
Keywords :
brain models; cellular biophysics; diseases; medical signal processing; neurophysiology; proteins; Alzheimer disease; amyloid plaque formation; beta-amyloid precursor; brain cells degeneration; fragment beta-amyloid protein; functional group; growth factors; insoluble plaques; neurons; neurotrophic growth factors; precursor protein; signal processing techniques; Aggregates; Alzheimer´s disease; Brain cells; Continuous wavelet transforms; Frequency; Neurons; Protection; Proteins; Resonance; Signal processing;
Conference_Titel :
Engineering in Medicine and Biology Society, 2003. Proceedings of the 25th Annual International Conference of the IEEE
Print_ISBN :
0-7803-7789-3
DOI :
10.1109/IEMBS.2003.1280446