Title :
Conducted EMI of DC–DC Converters With Parametric Uncertainties
Author :
Ferber, Matthew ; Vollaire, Christian ; Krahenbuhl, L. ; Coulomb, J.-L. ; Vasconcelos, Joao A.
Author_Institution :
Lab. Amp`ere, Ecole Centrale de Lyon, Ecully, France
Abstract :
This paper presents a new methodology to analyze the conducted interferences of power converters when its parameters are described by probability density functions rather than numerical values. The methodology is based on determining a set of surrogate models per frequency of the converter, which has less input and output variables, and shorter simulation time but similar precision for the evaluation of conducted emissions. This approach presents several advantages when compared to classical ones, such as Monte Carlo simulations and collocation methods. The results are presented as probability density functions and confidence intervals.
Keywords :
DC-DC power convertors; Monte Carlo methods; electromagnetic interference; probability; DC-DC converters; Monte Carlo simulations; collocation methods; conducted EMI; conducted emissions; parametric uncertainty; power converters; probability density functions; Capacitance; Electromagnetic interference; Inductance; Integrated circuit modeling; Resonant frequency; Sensitivity analysis; Uncertainty; Electromagnetic compatibility; power electronics; probability; uncertainty;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2012.2235443