• DocumentCode
    4070
  • Title

    Conducted EMI of DC–DC Converters With Parametric Uncertainties

  • Author

    Ferber, Matthew ; Vollaire, Christian ; Krahenbuhl, L. ; Coulomb, J.-L. ; Vasconcelos, Joao A.

  • Author_Institution
    Lab. Amp`ere, Ecole Centrale de Lyon, Ecully, France
  • Volume
    55
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    699
  • Lastpage
    706
  • Abstract
    This paper presents a new methodology to analyze the conducted interferences of power converters when its parameters are described by probability density functions rather than numerical values. The methodology is based on determining a set of surrogate models per frequency of the converter, which has less input and output variables, and shorter simulation time but similar precision for the evaluation of conducted emissions. This approach presents several advantages when compared to classical ones, such as Monte Carlo simulations and collocation methods. The results are presented as probability density functions and confidence intervals.
  • Keywords
    DC-DC power convertors; Monte Carlo methods; electromagnetic interference; probability; DC-DC converters; Monte Carlo simulations; collocation methods; conducted EMI; conducted emissions; parametric uncertainty; power converters; probability density functions; Capacitance; Electromagnetic interference; Inductance; Integrated circuit modeling; Resonant frequency; Sensitivity analysis; Uncertainty; Electromagnetic compatibility; power electronics; probability; uncertainty;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2012.2235443
  • Filename
    6408005