Wave reflection from porous ocean sediment with depth-dependent properties

This study examines the reflection characteristic of a thin-transition layer of the ocean bottom showing variability with respect to depth. Surficial sediment is modeled using the fluid approximation of the Biot model. The difference between the inherent frequency dependency of the reflection and the frequency dependency resulting from a thin transition layer is investigated. Using the recent fine-scale measurement data of the surficial sediment, we numerically simulated the reflection loss and investigated the contribution from both frequency dependencies. In addition, the effects of different sediment type and various depth structure of the sediment are discussed.