Electronic test solutions for FlowFET fluidic arrays

Author

Kerkhoff, Hans G. ; Acar, Mustafa

Author_Institution

Testable Design & Test of Microsyst. Group, MESA Res. Inst., Enschede, Netherlands

fYear

2003

fDate

5-7 May 2003

Firstpage

27

Lastpage

32

Abstract

The testable design and test of a software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control and interface electronics is presented. Test hardware is included for detecting faults in the DMOS electro-fluidic interface and the digital parts. Multi-domain fault modelling and simulation shows the effects of faults in the (combined) fluidic and electrical parts. Fault simulations also reveal important parameters of multi-domain test-stimuli for detecting both electrical and fluidic defects.

Keywords

fault simulation; field effect transistors; finite element analysis; microcontrollers; microfluidics; FlowFET fluidic arrays; electrical defects; electro-fluidic interface; electronic test solutions; fault simulations; fluidic defects; interface electronics; multidomain fault modelling; software-controllable lab; Chemical analysis; Circuit faults; Control system synthesis; Electrical fault detection; Electronic equipment testing; Etching; Fluid flow control; Manufacturing; Silicon; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Test, Integration and Packaging of MEMS/MOEMS 2003. Symposium on

Print_ISBN

0-7803-7066-X

Type

conf

DOI

10.1109/DTIP.2003.1287003

Filename

1287003