• DocumentCode
    408488
  • Title

    Congestion driven placement for VLSI standard cell design

  • Author

    Areibi, Shawki ; Yang, Zhen

  • Author_Institution
    Sch. of Eng., Guelph Univ., Ont., Canada
  • fYear
    2003
  • fDate
    9-11 Dec. 2003
  • Firstpage
    304
  • Lastpage
    307
  • Abstract
    The sub-micron regime has caused the interconnect delay to become a critical determiner of circuit performance. As a result, circuit placement is starting to play an important role in today´s high performance chip designs. In addition to wirelength optimization, the issue of reducing excessive congestion in local regions such that the router can finish the routing successfully is becoming another important problem. In this paper, a post-processing congestion reduction technique is implemented and incorporated into the flat and hierarchical placement. Results obtained show that the congestion-driven placement approach reduces the congestion by about 51% for flat designs and 37% for hierarchical designs with a slight increase in wirelength.
  • Keywords
    VLSI; circuit layout CAD; integrated circuit layout; integrated circuit modelling; VLSI standard cell design; chip design; circuit performance; congestion driven placement; congestion reduction technique; hierarchical placement; interconnect delay; wirelength optimization; Algorithm design and analysis; Chip scale packaging; Circuit optimization; Delay; Design automation; Integrated circuit interconnections; Phase estimation; Routing; Very large scale integration; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2003. ICM 2003. Proceedings of the 15th International Conference on
  • Print_ISBN
    977-05-2010-1
  • Type

    conf

  • DOI
    10.1109/ICM.2003.1287818
  • Filename
    1287818