DocumentCode
408488
Title
Congestion driven placement for VLSI standard cell design
Author
Areibi, Shawki ; Yang, Zhen
Author_Institution
Sch. of Eng., Guelph Univ., Ont., Canada
fYear
2003
fDate
9-11 Dec. 2003
Firstpage
304
Lastpage
307
Abstract
The sub-micron regime has caused the interconnect delay to become a critical determiner of circuit performance. As a result, circuit placement is starting to play an important role in today´s high performance chip designs. In addition to wirelength optimization, the issue of reducing excessive congestion in local regions such that the router can finish the routing successfully is becoming another important problem. In this paper, a post-processing congestion reduction technique is implemented and incorporated into the flat and hierarchical placement. Results obtained show that the congestion-driven placement approach reduces the congestion by about 51% for flat designs and 37% for hierarchical designs with a slight increase in wirelength.
Keywords
VLSI; circuit layout CAD; integrated circuit layout; integrated circuit modelling; VLSI standard cell design; chip design; circuit performance; congestion driven placement; congestion reduction technique; hierarchical placement; interconnect delay; wirelength optimization; Algorithm design and analysis; Chip scale packaging; Circuit optimization; Delay; Design automation; Integrated circuit interconnections; Phase estimation; Routing; Very large scale integration; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2003. ICM 2003. Proceedings of the 15th International Conference on
Print_ISBN
977-05-2010-1
Type
conf
DOI
10.1109/ICM.2003.1287818
Filename
1287818
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