DocumentCode
408505
Title
Impulse immunity test method for digital integrated circuits
Author
Bakshi, Sandeep T. ; Coenen, Mart
Author_Institution
Philips Digital Syst. Lab., EMC Competence Center, Eindhoven, Netherlands
fYear
2003
fDate
18-19 Dec. 2003
Firstpage
249
Lastpage
252
Abstract
A methodology is presented to test susceptibility of digital ICs for impulsive phenomenon. This paper gives an explanation of the impulse immunity test strategy and the test methods developed. Some results will be discussed.
Keywords
digital integrated circuits; immunity testing; impulse testing; integrated circuit testing; digital integrated circuits; impulse immunity test method; impulsive phenomenon; susceptibility test; Circuit testing; Clocks; Degradation; Digital integrated circuits; Electrostatic discharge; IEC standards; Immune system; Immunity testing; Impulse testing; Integrated circuit testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Interference and Compatibility, 2003. INCEMIC 2003. 8th International Conference on
Print_ISBN
81-900652-1-1
Type
conf
DOI
10.1109/ICEMIC.2003.1287844
Filename
1287844
Link To Document