Title :
Impulse immunity test method for digital integrated circuits
Author :
Bakshi, Sandeep T. ; Coenen, Mart
Author_Institution :
Philips Digital Syst. Lab., EMC Competence Center, Eindhoven, Netherlands
Abstract :
A methodology is presented to test susceptibility of digital ICs for impulsive phenomenon. This paper gives an explanation of the impulse immunity test strategy and the test methods developed. Some results will be discussed.
Keywords :
digital integrated circuits; immunity testing; impulse testing; integrated circuit testing; digital integrated circuits; impulse immunity test method; impulsive phenomenon; susceptibility test; Circuit testing; Clocks; Degradation; Digital integrated circuits; Electrostatic discharge; IEC standards; Immune system; Immunity testing; Impulse testing; Integrated circuit testing;
Conference_Titel :
Electromagnetic Interference and Compatibility, 2003. INCEMIC 2003. 8th International Conference on
Print_ISBN :
81-900652-1-1
DOI :
10.1109/ICEMIC.2003.1287844
