A method for tuning dielectric loaded accelerating structures

Author

Kanareykin, A. ; Gai, W. ; Power, J.G. ; Nenasheva, E. ; Karmanenko, S. ; Sheinman, I.

Author_Institution

LLC, Euclid Concepts, Solon, OH, USA

Volume

3

fYear

2003

fDate

12-16 May 2003

Firstpage

1888

Abstract

We present a method to vary the resonant frequency of a dielectric loaded accelerating (DLA) structure driven by either the wakefield of a beam or an external rf source. The structure consists of a thick ceramic layer backed by a thin layer of ferroelectric. The overall frequency of the DLA structure is tuned by applying a DC bias voltage to the ferroelectric layer in order to vary its permittivity. This scheme is needed to compensate for frequency shifts in DLA structures due to machining imperfections and dielectric constant heterogeneity. We have identified BST ferroelectric-oxides compounds as a suitable material for this application; it has a relative dielectric constant that can be tuned from 300 to 500. From this, we calculate that the overall frequency of the structure can be tuned over a range of (2÷4)% for an X-band DLA structure. In this paper, a detailed model of the DLA structure is given and an experimental test is proposed. We present cold test measurements for an 11.424 GHz planar tunable DLA structure.

Keywords

accelerator RF systems; beam handling techniques; dielectric-loaded waveguides; electron accelerators; ferroelectric thin films; particle beam diagnostics; permittivity; 11.424 GHz; BaSrTiO₃; DC bias voltage; DLA structures; X-band DLA structure; beam wakefield; ceramic layer; cold test measurements; dielectric constant heterogeneity; dielectric loaded accelerating structures; external radiofrequency source; frequency shifts; identified BST ferroelectric-oxides compounds; machining imperfections; permittivity; planar tunable DLA structure; resonant frequency; thin ferroelectric layer; tuning; Acceleration; Ceramics; Dielectric constant; Ferroelectric materials; Particle beams; Permittivity; Resonant frequency; Testing; Tuning; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the

ISSN

1063-3928

Print_ISBN

0-7803-7738-9

Type

conf

DOI

10.1109/PAC.2003.1288709

Filename

1288709