Title :
Generation of high brightness x-rays with the PLEIADES Thomson x-ray source
Author :
Brown, W.J. ; Anderson, S.G. ; Barty, C.P.J. ; Crane, J.K. ; Cross, R.R. ; Fittinghoff, D.N. ; Hartemann, F.V. ; Kuba, J. ; Le Sage, G.P. ; Slaughter, D.R. ; Springer, P.T. ; Tremaine, A.M. ; Rosenzweig, J.B. ; Gibson, D.J.
Author_Institution :
Lawrence Livermore Nat. Lab., CA, USA
Abstract :
The use of short laser pulses to generate high peak intensity, ultra-short x-ray pulses enables exciting new experimental capabilities, such as femtosecond pump-probe experiments used to temporally resolve material structural dynamics on atomic time scales. PLEIADES (Picosecond Laser Electron InterAction for the Dynamic Evaluation of Structures) is a next generation Thomson scattering x-ray source being developed at Lawrence Livermore National Laboratory (LLNL). Ultra-fast picosecond x-rays (10-200 keV) are generated by colliding an energetic electron beam (20-100 MeV) with a high intensity, sub-ps, 800 nm laser pulse. The peak brightness of the source is expected to exceed 1020 photons/s/0.1% bandwidth/nm2/mrad2. Simulations of the electron beam production, transport, and final focus are presented. Electron beam measurements, including emittance and final focus spot size are also presented and compared to simulation results. Measurements of x-ray production are also reported and compared to theoretical calculations.
Keywords :
X-ray production; electron accelerators; linear accelerators; particle beam diagnostics; 10 to 200 keV; 20 to 100 MeV; 800 nm; PLEIADES Thomson x-ray source; Picosecond Laser Electron InterAction for the Dynamic Evaluation of Structures; emittance; final focus spot size; high brightness x-rays; material structural dynamics; short laser pulses; ultra-fast picosecond x-rays; Atom lasers; Atomic beams; Brightness; Electron beams; Laser excitation; Optical materials; Optical pulse generation; Production; Pump lasers; X-ray lasers;
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
Print_ISBN :
0-7803-7738-9
DOI :
10.1109/PAC.2003.1288850
