Stray-electron accumulation and effects in HIF accelerators

Stray electrons can be introduced in positive-charge accelerators for heavy ion fusion (or other applications) as a result of ionization of ambient gas or gas released from walls due to halo-ion impact, or as a result of secondary-electron emission. Electron accumulation is impacted by the ion beam potential, accelerating fields, multipole magnetic fields used for beam focus, and the pulse duration. We highlight the distinguishing features of heavy-ion accelerators as they relate to stray-electron issues, and present first results from a sequence of simulations to characterize the electron cloud that follows from realistic ion distributions. Also, we present ion simulations with prescribed random electron distributions, undertaken to begin to quantify the effects of electrons on ion beam quality.