Title :
Lifetime reduction due to insertion devices at BESSY II
Author :
Feikes, J. ; Wustefeld, G.
Author_Institution :
BESSY, Berlin, Germany
Abstract :
After closing insertion devices at BESSY II to smallest gaps beside appearance of a vertical tune-shift due to the natural focusing of the IDs, it is observed that beam lifetime is considerably reduced, up to 30 %. The reduction neither depends on machine tune nor on the settings of the four BESSY II harmonic sextupole circuits. Here measurements and analytical results to explain and cure this effect are presented.
Keywords :
beam handling techniques; electron accelerators; particle beam diagnostics; particle beam stability; storage rings; BESSY II; BESSY II harmonic sextupole circuits; beam lifetime; insertion devices; lifetime reduction; vertical tune-shift; Frequency; Intrusion detection; Light sources; Monitoring; Optical distortion; Optical losses; Optical sensors; Resonance; Tuned circuits; Undulators;
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
Print_ISBN :
0-7803-7738-9
DOI :
10.1109/PAC.2003.1289497
