• DocumentCode
    409267
  • Title

    A critical analysis of IGBT geometries, with the intention of mitigating undesirable destruction caused by fault scenarios of an adverse nature

  • Author

    Leyh, G.E.

  • Author_Institution
    SLAC, Menlo Park, CA, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    12-16 May 2003
  • Firstpage
    1174
  • Abstract
    Megawatt class Insulated Gate Bipolar Transistors [IGBTs] find many uses in industrial applications such as traction drives, induction heating and power factor correction. At present, these devices are not optimized for higher speed pulsed-power applications, such as kicker magnets or klystron modulators. This paper identifies fundamental issues that limit the dI/dt performance of standard commercial packages, and investigates several IGBT design optimizations that significantly improve high-speed performance at high peak power levels. The paper presents design concepts, results of electromagnetic simulations, and performance data of actual prototypes under high dI/dt conditions.
  • Keywords
    insulated gate bipolar transistors; pulsed power supplies; IGBT design optimizations; IGBT geometries; electromagnetic simulations; fault scenarios; industrial applications; megawatt class insulated gate bipolar transistors; standard commercial packages; Design optimization; Geometry; Insulated gate bipolar transistors; Klystrons; Magnetic modulators; Magnets; Packaging; Power factor correction; Pulse modulation; Virtual prototyping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
  • ISSN
    1063-3928
  • Print_ISBN
    0-7803-7738-9
  • Type

    conf

  • DOI
    10.1109/PAC.2003.1289643
  • Filename
    1289643