Single-walled carbon nanotube probes for AFM imaging

Author

Zhang, Lian ; Ata, Erhan ; Minne, Stephen C. ; Hough, Paul

Author_Institution

Molecular Nanosyst., USA

fYear

2004

fDate

2004

Firstpage

438

Lastpage

441

Abstract

This paper discusses fabrication and characterization of single-walled carbon nanotube (SWNT) AFM probes. By selectively deposit catalytic nanoparticles onto commercial AFM probes with silicon tips, we are able to grow SWNTs on the wafer scale, with 30-50% usable probe yield. We also studied shortening of carbon nanotubes to achieve proper mechanical strength required for AFM application. Comparison shows that SWNT probes consistently reveal 50-100% more surface features than silicon probes. These probes are also successfully used in DNA imaging in a liquid solution.

Keywords

DNA; atomic force microscopy; biomedical imaging; carbon nanotubes; chemical vapour deposition; mechanical strength; molecular biophysics; nanoparticles; nanotechnology; probes; surface roughness; C; DNA imaging; atomic force microscopy probes; chemical vapour deposition; deoxyribonucleic acid; liquid solution; mechanical strength; nanotechnology; silicon tips; single walled carbon nanotubes; surface roughness; wafer scale production; Atomic force microscopy; Carbon nanotubes; Chemical vapor deposition; DNA; Fabrication; Force feedback; Image resolution; Nanoparticles; Probes; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)

Print_ISBN

0-7803-8265-X

Type

conf

DOI

10.1109/MEMS.2004.1290616

Filename

1290616