• DocumentCode
    410264
  • Title

    New approaches to defect characterisation with high resolution non-contacting laser ultrasound

  • Author

    Sharples, S. ; Clark, M. ; Somekh, M.G.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nottingham Univ., UK
  • Volume
    1
  • fYear
    2003
  • fDate
    5-8 Oct. 2003
  • Firstpage
    786
  • Abstract
    This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.
  • Keywords
    acoustic microscopy; crack detection; indentation; laser beam effects; optical microscopy; silicon compounds; ultrasonic imaging; ultrasonic materials testing; SiC; defect characterisation; defect detection; high resolution noncontacting laser ultrasound; laser ultrasonic imaging; Acoustic noise; Focusing; Frequency; Laser noise; Nonlinear optics; Optical noise; Optical surface waves; Signal generators; Ultrasonic imaging; Ultrasonic transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics, 2003 IEEE Symposium on
  • Print_ISBN
    0-7803-7922-5
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2003.1293518
  • Filename
    1293518