DocumentCode
410264
Title
New approaches to defect characterisation with high resolution non-contacting laser ultrasound
Author
Sharples, S. ; Clark, M. ; Somekh, M.G.
Author_Institution
Sch. of Electr. & Electron. Eng., Nottingham Univ., UK
Volume
1
fYear
2003
fDate
5-8 Oct. 2003
Firstpage
786
Abstract
This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.
Keywords
acoustic microscopy; crack detection; indentation; laser beam effects; optical microscopy; silicon compounds; ultrasonic imaging; ultrasonic materials testing; SiC; defect characterisation; defect detection; high resolution noncontacting laser ultrasound; laser ultrasonic imaging; Acoustic noise; Focusing; Frequency; Laser noise; Nonlinear optics; Optical noise; Optical surface waves; Signal generators; Ultrasonic imaging; Ultrasonic transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN
0-7803-7922-5
Type
conf
DOI
10.1109/ULTSYM.2003.1293518
Filename
1293518
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