Electromagnetic scattering from rough surfaces with the first- and second-order Kirchhoff approximation in high-frequency limit

Author

Bourlier, C. ; Déchamps, N. ; Berginc, G.

Author_Institution

CNRS, Ecole polytechnique de l´´universite de Nantes, France

Volume

1

fYear

2003

fDate

21-25 July 2003

Firstpage

115

Abstract

The incoherent scattering coefficient based on the first- and second-order Kirchhoff approximation is calculated, where the second-order illuminated function derived from recent works is taken into account. To reduce the number of numerical integrations, the geometric optics approximation is used. For a Gaussian process, the model is then compared with exact numerical method, measurements and Ishimaru´s model.

Keywords

Gaussian processes; electromagnetic wave scattering; remote sensing; topography (Earth); EFIE; Gaussian process; Ishimaru model; electromagnetic field integral equation; electromagnetic scattering; first-order Kirchhoff approximation; geometric optics approximation; incoherent scattering coefficient; method of moments; numerical integrations; rough surfaces; second-order Kirchhoff approximation; second-order illuminated function; Backscatter; Electromagnetic scattering; Gaussian processes; Geometrical optics; Kirchhoff´s Law; Optical scattering; Optical surface waves; Rough surfaces; Shadow mapping; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Geoscience and Remote Sensing Symposium, 2003. IGARSS '03. Proceedings. 2003 IEEE International

Print_ISBN

0-7803-7929-2

Type

conf

DOI

10.1109/IGARSS.2003.1293696

Filename

1293696