DocumentCode :
41058
Title :
Evaluation and Simulation of a New Ionization Chamber Design for use in Computed Tomography Beams
Author :
Perini, Ana P. ; Neves, Lucio P. ; Fernandez-Varea, J.M. ; Buermann, L. ; Caldas, L.V.E.
Author_Institution :
Inst. de Pesquisas Energeticas e Nucl., Cidade Univ., Sao Paulo, Brazil
Volume :
60
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
768
Lastpage :
773
Abstract :
A newly-designed pencil ionization chamber with a sensitive volume of 3.4 cm3 was evaluated at the Calibration Laboratory of IPEN (São Paulo, Brazil) for use in the dosimetry of computed tomography (CT) medical equipment. The main differences between this CT ionization chamber and the commercial ones are related to the respective design and constituent materials. In the ionization chamber characterized in this work an alternative wall material was tested and a different BNC connector position was evaluated. This novel dosimeter was also designed to have an assembling process as simple and cheap as possible. To estimate the chamber performance, several pre-operational tests were undertaken. The energy dependence test was also evaluated using Monte Carlo simulation with the PENELOPE code system. In addition, Monte Carlo simulations were done to study the influence of various components on the energy deposition in its sensitive volume. The results obtained in the tests showed that the analyzed configuration of the CT ionization chamber is a good alternative for use in CT dosimetry, because it is easy to construct, and it presents a relatively low cost.
Keywords :
computerised tomography; dosimetry; ionisation chambers; BNC connector position; IPEN Calibration Laboratory; Monte Carlo simulation; PENELOPE code system; alternative wall material; computed tomography beams; computed tomography dosimetry; computed tomography medical equipment; ionization chamber design; pencil ionization chamber; pre-operational tests; sensitive volume; Computed tomography; Connectors; IEC standards; Ionization chambers; Materials; Monte Carlo methods; Semiconductor process modeling; Computed tomography (CT); Monte Carlo simulation; dosimetry; pencil ionization chamber;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2233752
Filename :
6428665
Link To Document :
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