DocumentCode
410728
Title
The dependence of polarimetric coherence on surface roughness for very rough surfaces
Author
Malhotra, Saurabh ; Kasilingam, Dayalan ; Schuler, Dale
Author_Institution
University of Massachusetts
Volume
3
fYear
2003
fDate
21-25 July 2003
Firstpage
1654
Lastpage
1656
Keywords
Backscatter; Coherence; Dielectric measurements; Frequency; Geophysical measurements; Laboratories; Polarization; Radar scattering; Rough surfaces; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2003. IGARSS '03. Proceedings. 2003 IEEE International
Print_ISBN
0-7803-7929-2
Type
conf
DOI
10.1109/IGARSS.2003.1294207
Filename
1294207
Link To Document