DocumentCode :
411435
Title :
Comparative evaluation of probabilistic neural network versus support vector machines classifiers in discriminating ERP signals of depressive patients from healthy controls
Author :
Kalatzis, I. ; Piliouras, N. ; Ventouras, E. ; Papageorgiou, C.C. ; Rabavilas, A.D. ; Cavouras, D.
Author_Institution :
Dept. of Med. Instrum. Technol., Technol. Educ. Instn. of Athens, Greece
Volume :
2
fYear :
2003
fDate :
18-20 Sept. 2003
Firstpage :
981
Abstract :
This paper describes the design of classification system capable of distinguishing patients with depression from normal controls by event-related potential (ERP) signals using the P600 component. Clinical material comprised twenty-five patients with depression and an equal number of gender and aged-matched healthy controls. All subjects were evaluated by a computerized version of the digit span Wechsler test. EEC activity was recorded from 15 scalp electrodes and recordings were digitized for further computer processing. Features related to the shape of the waveform were generated using a dedicated custom software interface system developed in C++ for the purposes of this work. A software classification system was designed, consisting of (a) two classifiers, the probabilistic neural network (PNN) and the support vector machines (SVM), (b) two routines for feature reduction and feature selection, and (c) an overall system evaluation routine, comprising the exhaustive search and the leave-one-out methods. Highest classification accuracies achieved were 92% for the PNN and 96% for the SVM, using the ´latency/amplitude ratio´ and ´peak-to-peak slope´ two-feature combination. In conclusion, employing computer-based pattern recognition techniques with features not easily evaluated by the clinician, patients with depression could be distinguished from healthy subjects with high accuracy.
Keywords :
C++ language; electroencephalography; feature extraction; medical signal processing; neural nets; patient diagnosis; probability; signal classification; support vector machines; C++; EEC activity; ERP; PNN; SVM; clinical material; digit span Wechsler test; event-related potential signal; feature reduction; feature selection; leave-one-out method; pattern recognition technique; probabilistic neural network; software classification system; software interface system; support vector machines; Control systems; Electrodes; Enterprise resource planning; Neural networks; Scalp; Signal design; Software systems; Support vector machine classification; Support vector machines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Signal Processing and Analysis, 2003. ISPA 2003. Proceedings of the 3rd International Symposium on
Print_ISBN :
953-184-061-X
Type :
conf
DOI :
10.1109/ISPA.2003.1296422
Filename :
1296422
Link To Document :
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