DocumentCode
411712
Title
Sub-wavelength resolution using apertureless terahertz near-field microscopy
Author
Wang, Kanglin ; Barkan, Adrian ; Mittleman, Daniel M.
Author_Institution
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
fYear
2003
fDate
6-6 June 2003
Abstract
We demonstrate apertureless near-field terahertz imaging by introducing a metallic probe above a sample surface. The amplitude of the scattered pulses is very sensitive to the tip-sample distance. A spatial resolution of /spl lambda//520 is demonstrated.
Keywords
image resolution; near-field scanning optical microscopy; submillimetre wave imaging; apertureless terahertz near-field microscopy; metallic probe; pulse scattering; sub-wavelength resolution; terahertz imaging; Optical imaging; Optical microscopy; Optical receivers; Optical scattering; Optical sensors; Optical surface waves; Probes; Surface topography; Surface waves; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-748-2
Type
conf
Filename
1297793
Link To Document