Title :
Packaging-induced strain in quantum-well laser diodes: theory and experiment
Author :
Biermann, Mark L. ; Holland, Joseph ; Tomm, Jens W. ; Gerhardt, Axel ; Lorenzen, Dirk
Author_Institution :
Dept. of Phys., US Naval Acad., Annapolis, MD, USA
Abstract :
Interband energy shifts due to strain that arises via a combination of diode-laser, device-packaging effects and lattice-mismatch are theoretically modeled and used to interpret the strain situation in commercial devices.
Keywords :
packaging; quantum well lasers; strain measurement; device-packaging effects; diode-laser; interband energy shifts; lattice-mismatch; packaging-induced strain; quantum-well laser diodes; Capacitive sensors; Diode lasers; Lattices; Lead; Optical devices; Optical sensors; Quantum well lasers; Semiconductor device packaging; Semiconductor diodes; Strain measurement;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-748-2
