DocumentCode
411892
Title
Packaging-induced strain in quantum-well laser diodes: theory and experiment
Author
Biermann, Mark L. ; Holland, Joseph ; Tomm, Jens W. ; Gerhardt, Axel ; Lorenzen, Dirk
Author_Institution
Dept. of Phys., US Naval Acad., Annapolis, MD, USA
fYear
2003
fDate
6-6 June 2003
Abstract
Interband energy shifts due to strain that arises via a combination of diode-laser, device-packaging effects and lattice-mismatch are theoretically modeled and used to interpret the strain situation in commercial devices.
Keywords
packaging; quantum well lasers; strain measurement; device-packaging effects; diode-laser; interband energy shifts; lattice-mismatch; packaging-induced strain; quantum-well laser diodes; Capacitive sensors; Diode lasers; Lattices; Lead; Optical devices; Optical sensors; Quantum well lasers; Semiconductor device packaging; Semiconductor diodes; Strain measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-748-2
Type
conf
Filename
1298039
Link To Document