DocumentCode :
41214
Title :
Design of Closed-Loop Detection System for Optical Voltage Sensors Based on Pockels Effect
Author :
Hui Li ; Lan Bi ; Rui Wang ; LiJing Li ; Zhili Lin ; Chunxi Zhang
Author_Institution :
Sch. of Instrum. Sci. & Optoelectron. Eng., Beihang Univ., Beijing, China
Volume :
31
Issue :
12
fYear :
2013
fDate :
15-Jun-13
Firstpage :
1921
Lastpage :
1928
Abstract :
A closed-loop detection system is established to make optical voltage sensors (OVSs) based on Pockels effect particularly ideal for high-voltage applications. For the closed-loop OVSs, the signal intensity fluctuation due to temperature variation contributes to the gain drift of the forward channel and finally influences the dynamic performance of the OVSs. Meanwhile, the closed-loop error of the OVS is also a weak signal that is hard to be accurately extracted. In this work, we propose a signal detection circuit based on weak signal detection theory to reduce noise levels for improving detection accuracy of OVS. In consideration of the influence of signal intensity fluctuation, we design a control algorithm for the closed-loop detection system to guarantee that the OVS is exponentially stable in order to have a fast dynamic response. The experimental results show that the OVS based on the proposed closed-loop system has accuracy within 0.2%, a fast rise time less than 25.2 μs and a wide bandwidth up to 24.5 kHz.
Keywords :
Pockels effect; closed loop systems; optical sensors; Pockels effect; closed-loop detection system; closed-loop error; control algorithm; dynamic performance; forward channel; gain drift; high-voltage applications; noise levels; optical voltage sensors; signal detection circuit; signal intensity fluctuation; temperature variation; weak signal detection theory; Frequency modulation; Heuristic algorithms; Noise; Optical sensors; Signal detection; Voltage measurement; Closed-loop detection; dynamic performance; optical voltage sensor;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2013.2260855
Filename :
6510448
Link To Document :
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