• DocumentCode
    413475
  • Title

    Metastability in boron-doped multicrystalline silicon wafers and solar cells

  • Author

    Dhamrin, Marwan ; Kayamori, Yuki ; Hashigami, Hiroshi ; Saitoh, Tadashi

  • Author_Institution
    Tokyo Univ. of Agric. & Technol., Japan
  • Volume
    3
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    2905
  • Abstract
    Metastability of boron-doped multicrystalline silicon wafers and solar cells under illumination has been investigated. Lifetimes of boron-doped multicrystalline silicon wafer degrade very rapidly within the first 30 min under 1 sun illumination to about 40% of its initial values. Carrier lifetime distribution maps show that high lifetime regions degraded more than lower regions. The same tendency of rapid degradation is observed in B-doped conventional cast multicrystalline silicon solar cells where short circuit current, open circuit voltage and efficiency degrade very rapidly by only 3% within few minutes of illumination. Possibilities of elimination of light-induced degradation by means of using gallium as dopant instead of boron are investigated. Carrier lifetimes of Ga-doped wafers show certain stability under illumination. The same stability is found in Ga-doped solar cells.
  • Keywords
    boron; carrier lifetime; elemental semiconductors; gadolinium; heat transfer; short-circuit currents; silicon; solar cells; 30 min; Ga doped solar cell; Si:B; Si:Ga; boron doped multicrystalline silicon wafer; carrier lifetime distribution map; gallium doped multicrystalline silicon wafer; light induced degradation; metastability; open circuit voltage; short circuit current; solar cell; sun illumination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305188