Title :
Effect of variation of indium on structural and optical properties of indium sulfide thin films
Author :
John, Teny Theresa ; VijayaKumar, K.P. ; Kartha, Sudha C. ; Kashiwaba, Y. ; Abe, T.
Author_Institution :
Dept. of Phys., Cochin Univ. of Sci. & Technol., Kochi, Japan
Abstract :
Attention has recently been paid to In/sub 2/S/sub 3/ thin films because of their potential application as buffer layer in CIGS based solar cells. Indium sulfide thin films were prepared using chemical spray pyrolysis (CSP) Technique and were characterized using XRD, XPS, photosensitivity measurements and optical absorption studies. XRD studies revealed that the samples were /spl beta/-In/sub 2/S/sub 3/. Variation in photosensitivity was studied by varying indium concentration in the solution keeping sulfur concentration at 3, 6 and 8 as In/S ratio has got great influence on photosensitivity. The sample having In/S ratio 1.2/8 showed maximum photosensitivity.
Keywords :
III-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; indium compounds; infrared spectra; photochemistry; pyrolysis; semiconductor thin films; solar cells; CIGS based solar cell; In/S ratio; In/sub 2/S/sub 3/; X-ray diffraction; X-ray photoelectron spectra; XPS; XRD; buffer layer; chemical spray pyrolysis; indium concentration; optical absorption; optical properties; photosensitivity; structural properties; thin film;
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3
