Title :
CIGSSE module pilot processing: from fundamental investigations to advanced performance
Author :
Probst, Volker ; Stetter, Walter ; Palm, Joerg ; Toelle, Rainer ; Visbeck, Sven ; Calwer, Hermann ; Niesen, Tim ; Vogt, Helmut ; Hernández, Oscar ; Wendl, Michael ; Karg, Franz H.
Author_Institution :
Shell Solar GmbH, Munich, Germany
Abstract :
A process for high efficiency large area Cu(In,Ga)(Se,S)/sub 2/ thin film (ClGSSe) solar modules is developed applying rapid thermal processing and controlled sodium doping. Continuous optimization targets at sufficient process maturity to successfully transfer into cost effective mass production. The pilot line yields aperture area efficiencies of 11% (average) for 30/spl times/30 cm/sup 2/ modules and a certified champion efficiency of 13.1% for the first 60/spl times/90 cm/sub 2/ demonstrator module unencapsulated. A favourable double band gap grading structure is accomplished by controlled sulfur profiling and by natural gallium accumulation towards the back electrode. The stability of the frameless low cost packaged pilot line modules against humidity is confirmed externally by passing the damp heat test sequence according to IEC 61646. First Cd-free 30/spl times/30 cm/sup 2/ circuits yield up to 11.9% efficiency applying CBD-Zn(S,OH)-buffer layers.
Keywords :
IEC standards; copper compounds; energy gap; gallium compounds; humidity; indium compounds; mass production; rapid thermal processing; semiconductor doping; semiconductor thin films; sodium; solar cells; ternary semiconductors; 11 percent; 13.1 percent; CIGSSE module pilot processing; Cu(InGa)(SeS)/sub 2/:Na; IEC 61646; back electrode; buffer layers; certified champion efficiency; controlled sodium doping; controlled sulfur profiling; cost effective mass production; damp heat test sequence; double band gap grading structure; humidity; pilot line; rapid thermal processing; solar module;
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3
