• DocumentCode
    413747
  • Title

    Assessing the role of transition metals in shunting mechanisms using synchrotron-based techniques

  • Author

    Buonassisi, Tonio ; Vyvenko, O.F. ; Istratov, Andrei A. ; Weber, Eicke R. ; Hahn, Giso ; Sontag, D. ; Rakotoniaina, Jean-Patrice ; Breitenstein, Otwin ; Isenberg, Joerg ; Schindler, Roland

  • Author_Institution
    Lawrence Berkeley Nat. Lab., California Univ., Berkeley, CA, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    1120
  • Abstract
    Shunts in RGS and BaySix materials have been analyzed using a powerful combination of techniques including lock-in thermography, X-ray beam induced current, and X-ray fluorescence microscopy. Transition metals have been identified at shunt locations in both materials. Titanium and silver were found at a shunt in BaySix material, suggesting a process-induced defect related to faulty metallization grid deposition. Iron and copper were found at inversion channels in RGS material, suggesting these extended defects are effective gettering sites for transition metals, which enhance the generation-recombination current in this extended space-charge region. The role of transition metals in certain shunting mechanisms in multicrystalline silicon (mc-Si) solar cells is assessed in light of these experimental data.
  • Keywords
    X-ray microscopy; copper; elemental semiconductors; getters; infrared imaging; iron; metallisation; silicon; silver; solar cells; space charge; titanium; Ag; BaySix materials; Cu; Fe; Si; Ti; X-ray beam induced current; X-ray fluorescence microscopy; copper; faulty metallization grid deposition; generation recombination current; gettering site; iron; multicrystalline silicon solar cells; process induced defect; shunting mechanisms; silver; space charge region; synchrotron based techniques; thermography; titanium; transition metals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1306111