• DocumentCode
    413891
  • Title

    Influence of the crystalline fraction on the stability of nanocrystalline silicon solar cells

  • Author

    Fonrodona, M. ; Soler, D. ; Asensi, J.M. ; Bertomeu, J. ; Andreu, J.

  • Author_Institution
    Dept. Fisica Aplicada i Opt., Barcelona Univ., Spain
  • Volume
    2
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    1768
  • Abstract
    Recent results in nanocrystalline silicon solar cells have drawn attention to the material grown near the transition to amorphous growth, where best efficiencies have been reported. In this paper, the stability of nanocrystalline silicon solar cells deposited by Hot-Wire Chemical Vapour Deposition with relation to their microstructure is studied by means of Variable Illumination Measurement (VIM). The possible creation of light induced defects during 1000 hours of 100 mW/cm/sup 2/ light soaking has been monitored. Different amount of amorphous phase in the active layer of the device has been achieved by changing the hydrogen dilution used. After 1000 hours of light soaking, several initial irreversible changes in the performance of the solar cell have been found. Nevertheless, only the cell with the lowest crystalline fraction (X/sub c/ /spl sim/40%) suffered from reversible creation of light induced defects. This effect was not seen in other devices with X/sub c/ /spl sim/50%, where the dangling bond density was almost constant during all the light soaking process.
  • Keywords
    CVD coatings; amorphous semiconductors; dangling bonds; elemental semiconductors; nanostructured materials; silicon; solar cells; 1000 h; Si:H; amorphous phase; crystalline fraction; dangling bond density; hot wire chemical vapour deposition; hydrogen dilution; light induced defects; light soaking; nanocrystalline silicon solar cells; stability; variable illumination measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1306276