Title :
A role of a-Si:H buffer layer for controlling the impurity profiles near p/i interface of microcrystalline silicon solar cell
Author :
Taira, Shigeham ; Shima, Masala ; Murata, Kenji ; Tanaka, Makoto
Author_Institution :
Mater. & Devices Dev. Center, Sanyo Electr. Co. Ltd., Hyogo, Japan
Abstract :
The application of a high-quality hydrogenated amorphous silicon (a-Si:H) buffer layer to a hydrogenated microcrystalline silicon (/spl mu/c-Si:H) solar cell was investigated. It was revealed that /spl mu/c-Si:H solar cells with and without the buffer layer showed different profiles for impurities in the active layer, especially near the p/i interface. The efficiency of the /spl mu/c-Si:H solar cells with the a-Si:H buffer layer was completely stable during light irradiation, while the solar cell without the buffer layer showed small variations in efficiency. These results suggests that an a-Si:H buffer layer is effective for the suppression of the amount of impurities in the active layer, especially near the p/i interface, and also for suppressing variations in the output properties of the /spl mu/c-Si:H solar cell. Based on the results, a conversion efficiency of 9.33% was obtained for a /spl mu/c-Si:H solar cell that showed no variation in efficiency.
Keywords :
amorphous semiconductors; current density; elemental semiconductors; impurity distribution; plasma CVD coatings; semiconductor thin films; short-circuit currents; silicon; solar cells; Si; conversion efficiency; hydrogenated amorphous silicon buffer layer; hydrogenated microcrystalline silicon solar cell; impurity profiles; light irradiation; output properties; p-i interface; plasma CVD;
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3