DocumentCode :
413905
Title :
3-dimensional optical model for thin film silicon solar cells
Author :
Springer, J. ; Poruba, A. ; Mullerova, L. ; Vanecek, M. ; Reetz, W. ; Muller, Johannes
Author_Institution :
Inst. of Phys., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
Volume :
2
fYear :
2003
fDate :
18-18 May 2003
Firstpage :
1827
Abstract :
This paper addresses optical effects in small area thin film silicon p-i-n solar cells deposited on a glass/TCO substrate. An existing one-dimensional model was extended to three dimensions to include the effect of substrate glass thickness and lateral solar cell area. With its help we can model real laboratory cells where the cell dimensions are comparable to the glass thickness. For a quantitative evaluation we compare the external quantum efficiency of an infinitely large solar cell with small area cells. Here the modeling results show increasing differences with increasing glass thickness, decreasing cell area and improving light scattering properties of the TCO. This is explained by internal light trapping in the glass substrate, which causes loss or gain of light intensity absorbed in the cell area. Neglecting such effects can lead to about 11% error in short circuit current density calculated from quantum efficiency measurements.
Keywords :
amorphous semiconductors; current density; elemental semiconductors; light absorption; light scattering; radiation pressure; semiconductor thin films; short-circuit currents; silicon; solar cells; Si; amorphous silicon; external quantum efficiency; glass substrate; internal light trapping; light intensity; light scattering properties; optical effects; p-i-n solar cells; short circuit current density; thin film silicon solar cells; three-dimensional optical model; transparent conductive oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3
Type :
conf
Filename :
1306292
Link To Document :
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