Title :
Terahertz Sensor for Non-Contact Thickness and Quality Measurement of Automobile Paints of Varying Complexity
Author :
Ke Su ; Yao-chun Shen ; Zeitler, J. Axel
Author_Institution :
Dept. of Chem. Eng. & Biotechnol., Univ. of Cambridge, Cambridge, UK
Abstract :
In this paper, we propose to use terahertz pulsed imaging (TPI) as a novel tool to measure the thickness and quality of up to four layers of car paint on both metallic and non-metallic substrates. Using a rigorous one-dimensional electromagnetic model for terahertz propagation in a multi-layered medium combined with a numerical fitting method, the refractive index, extinction coefficient, and thickness of individual paint layers were determined. This proposed method was shown to be able to resolve coating layers down to a thickness of 18 μm and was validated for both single- and multi-layer automobile paint samples. Results of the terahertz measurements were benchmarked against other techniques that are currently used for non-destructive testing during car manufacture: ultrasound and eddy current measurements, as well as two reference techniques, X-ray microcomputed tomography and surface profilometry. Good consistency was found between the techniques. Compared to conventional techniques, TPI has the advantage that it is a non-contact method and that it is able to spatially resolve the thickness uniformity distribution information by two-dimensional mapping.
Keywords :
automobile manufacture; coatings; computerised tomography; eddy current testing; paints; quality control; terahertz wave detectors; ultrasonic materials testing; X-ray microcomputed tomography; automobile paints; car manufacture; coating layers; eddy current measurement; noncontact thickness measurement; nondestructive testing; numerical fitting method; quality measurement; refractive index; surface profilometry; terahertz pulsed imaging; terahertz sensor; ultrasound testing; Current measurement; Optical refraction; Optical variables control; Paints; Substrates; Thickness measurement; Ultrasonic variables measurement; Optical properties; optical time domain reflectometry; terahertz imaging; thin films;
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
DOI :
10.1109/TTHZ.2014.2325393