Title :
A statistical approach to developing channel models for network simulations
Author :
McDougall, Jeff ; Yu, Yi ; Miller, Scott
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
In this paper, we investigate the development of channel models for wireless network simulations based upon distributions of a representative frame error process. Our approach utilizes the distributions of 1) good frame run lengths and 2) bad frame run lengths as a metric for developing low complexity channel models. Two unique, low complexity flat Rayleigh fading channel approximations are generated and compared against the traditional two-state Markov approximation. We quantify the performance of channel approximations through ns2 network simulations. This work furthers the understanding of channel model development by proposing a metric by which to design and evaluate channel approximations. In addition, this metric is evaluated for the case of flat Rayleigh fading.
Keywords :
Rayleigh channels; error statistics; radio networks; channel models; flat Rayleigh fading channel approximations; frame error process; frame run lengths; ns2 network; statistical approach; wireless network simulations; Computational modeling; Error analysis; Fading; Physical layer; Rayleigh channels; Signal to noise ratio; Statistics; Wireless application protocol; Wireless networks; Wireless sensor networks;
Conference_Titel :
Wireless Communications and Networking Conference, 2004. WCNC. 2004 IEEE
Print_ISBN :
0-7803-8344-3
DOI :
10.1109/WCNC.2004.1311802