• DocumentCode
    415523
  • Title

    Predictive simulation of microdevices and microsystems: The basis of virtual prototyping

  • Author

    Wachutka, G. ; Schrag, G. ; Sattler, R.

  • Author_Institution
    Inst. for Phys. of Electrotechnol., Munich Univ. of Technol., Germany
  • Volume
    1
  • fYear
    2004
  • fDate
    16-19 May 2004
  • Firstpage
    71
  • Abstract
    The rapid progress in microsystems technology is increasingly supported by MEMS-specific modeling methodologies and dedicated simulation tools. These do not only enable the visualization of fabrication processes and operational principles, but they also assist the designer in making decisions with a view to finding optimized microstructures under technological and economical constraints. Currently strong efforts are being made towards simulation platforms for the predictive simulation of microsystems, i.e. the "virtual fabrication" and "virtual experimentation and characterization" on the computer. We discuss the most important aspects to be focussed on and practicable methodologies for microdevice and system modeling, in particular the consistent treatment of coupled fields and coupled domains required for setting up physically-based models for full system mixed-level simulation, and for the reliable validation and accurate calibration of the models.
  • Keywords
    micromechanical devices; semiconductor device models; virtual prototyping; MEMS-specific modeling methodologies; calibration; dedicated simulation tools; economical constraints; fabrication processes; full system mixed-level simulation; microdevices; microsystems; operational principles; predictive simulation; technological constraints; virtual prototyping; Computational modeling; Computer simulation; Constraint optimization; Design optimization; Economic forecasting; Fabrication; Microstructure; Predictive models; Virtual prototyping; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2004. 24th International Conference on
  • Print_ISBN
    0-7803-8166-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2004.1314560
  • Filename
    1314560