• DocumentCode
    415640
  • Title

    Transient-LU failure analysis of the ICs, methods of investigation and computer aided simulations

  • Author

    Domanski, K. ; Bargstädt-Franke, S. ; Stadler, Wolfgang ; Streibl, M. ; Steckert, G. ; Bala, W.

  • Author_Institution
    DAT LIB IO, Infineon Technol. AG,, Munich, Germany
  • fYear
    2004
  • fDate
    25-29 April 2004
  • Firstpage
    370
  • Lastpage
    374
  • Abstract
    With the ongoing technology downscaling transient latch-up (TLU) becomes increasingly important. There is a common understanding that TLU is even a higher risk than the static LU. The comprehensive TLU analysis of three different products in combination with detailed failure analysis and TCAD simulations have been presented in this paper.
  • Keywords
    failure analysis; integrated circuit reliability; integrated circuit testing; technology CAD (electronics); transient analysis; TCAD simulations; computer aided simulations; transient latch-up; transient-LU failure analysis; Analytical models; Computational modeling; Computer simulation; Failure analysis; Integrated circuit noise; Power supplies; Surges; Testing; Thermal stresses; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International
  • Print_ISBN
    0-7803-8315-X
  • Type

    conf

  • DOI
    10.1109/RELPHY.2004.1315354
  • Filename
    1315354
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=415640