DocumentCode
415940
Title
The challenge of ultra thin chip assembly
Author
Feil, Michael ; Adler, Cliff ; Hemmetzberger, Dieter ; Konig, Martin ; Bock, Karlheinz
Author_Institution
Fraunhofer-Inst. for Reliability & Microintegration, Munchen, Germany
Volume
1
fYear
2004
fDate
1-4 June 2004
Firstpage
35
Abstract
Because of their low height, the low assembly topography and their mechanical flexibility, ultra thin chips (about 20 μm) offer a wide field of possible applications. During the last years, the Fraunhofer-Institute for Reliability and Microintegration has successfully investigated in production, handling and assembly processes for such thin ICs. The chip handling and assembly processes had to be adopted to the very thin material, beginning with the development of special dicing by thinning process. A new pick and place process using thermal releasable tapes has been developed. For the chip assembly and contacting various methods depending on the application are available. This includes face up or face down variations. The complete process chain from wafer processing up to the assembled ultra thin IC together with some application examples are discussed in this paper.
Keywords
chip scale packaging; curing; etching; flip-chip devices; integrated circuit interconnections; microassembling; wafer bonding; chip handling; chip mounting; complete process chain; dicing by thinning; die attachment; electrical interconnection; face down variations; face up variations; flip chip interconnection; isoplanar interconnection; low assembly topography; low height; mechanical flexibility; pick and place process; special dicing; spin-etching; thermal releasable tapes; transponder modules; ultrathin IC; ultrathin chip assembly; wafer bonding; wafer processing; wafer thinning; Application specific integrated circuits; Assembly; Electronic switching systems; Etching; Packaging machines; Production; Sawing; Semiconductor device packaging; Silicon; Surfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN
0-7803-8365-6
Type
conf
DOI
10.1109/ECTC.2004.1319312
Filename
1319312
Link To Document