DocumentCode
415953
Title
Development on wafer level anisotropic conductive film for flip-chip interconnection
Author
Souriau, Jean-Charles ; Brun, Jean ; Franiatte, Rémi ; Gasse, Adrien
Author_Institution
CEA-Grenoble-LETI, Grenoble, France
Volume
1
fYear
2004
fDate
1-4 June 2004
Firstpage
155
Abstract
With the fast growth of multimedia, the packaging has to satisfy high interconnection density, high data throughput, miniaturization, easy thermal management and reliability needs while keeping a low cost. Flip-chip, which probably offers the best solution to meet these requirements, has been chosen by major companies in various configurations: FCOB (flip-chip on board), WLCSP (wafer level chip scale package) and WLP (wafer level packaging). Flip-chip interconnection using micro-balls is a common interconnection technique and major developments are being carried out on wafer bumping. In this paper, a new bumping approach on the IC wafer with z-axis ACF (anisotropic conductive film) is presented. This WL-ACF concept proposes a universal solution for bumping as there is no specific rule design to be taken into account. Moreover, the z-axis ACF developed at CEA-LETI gives the possibility of achieving lower pitch and pad area as well as good electrical contact and reliability. WL-ACF is evaluated on a specific test vehicle assembly and compared with localized micro insert bumping and hybridization with standard ACF.
Keywords
anisotropic media; chip scale packaging; contact resistance; fine-pitch technology; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; FCOB; WL-ACF; WLCSP; WLP; contact resistance; electrical contact reliability; fine pitch connections; flip-chip interconnection; flip-chip on board; high interconnection density; micro-balls; small pad area; wafer bumping; wafer level anisotropic conductive film; wafer level chip scale package; wafer level packaging; z-axis ACF; Anisotropic conductive films; Assembly; Chip scale packaging; Contacts; Costs; Testing; Thermal management; Throughput; Vehicles; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN
0-7803-8365-6
Type
conf
DOI
10.1109/ECTC.2004.1319329
Filename
1319329
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