• DocumentCode
    415955
  • Title

    Emerging challenges of underfill for flip chip application

  • Author

    Chen, Tim ; Wang, Jinlin ; Lu, Daoqiang

  • Author_Institution
    Dept. of Mater. Technol. Oper., Intel Corp., Chandler, AZ, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    175
  • Abstract
    The emerging challenges of underfill technology development for future generations of flip chip applications are reviewed, including capillary underfill materials, underfill processes, and alternative underfill technology. The driving trends of silicon technologies such as copper damascene, low-k dielectrics, low power consumption, and packaging technologies, including shrinking flip chip bump pitch, diameter and gap height, lead-free interconnection, thin die, small form factor and low profile packaging continue to demand innovations in underfill materials, processes, and integration approaches for the technologies.
  • Keywords
    chip scale packaging; encapsulation; filled polymers; flip-chip devices; integrated circuit interconnections; integrated circuit metallisation; Cu; bump diameter; capillary underfill materials; copper damascene; flip chip bump pitch; flip chip gap height; flip chip packaging; highly filled epoxy resins; lead-free interconnections; low power consumption electronics; low profile packaging; low-k dielectrics; small form factor package; thin die structures; underfill processes; underfill technology; Adhesives; Flip chip; Materials science and technology; Packaging; Passivation; Predictive models; Silicon; Surface tension; Temperature; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1319333
  • Filename
    1319333