Title :
Emerging challenges of underfill for flip chip application
Author :
Chen, Tim ; Wang, Jinlin ; Lu, Daoqiang
Author_Institution :
Dept. of Mater. Technol. Oper., Intel Corp., Chandler, AZ, USA
Abstract :
The emerging challenges of underfill technology development for future generations of flip chip applications are reviewed, including capillary underfill materials, underfill processes, and alternative underfill technology. The driving trends of silicon technologies such as copper damascene, low-k dielectrics, low power consumption, and packaging technologies, including shrinking flip chip bump pitch, diameter and gap height, lead-free interconnection, thin die, small form factor and low profile packaging continue to demand innovations in underfill materials, processes, and integration approaches for the technologies.
Keywords :
chip scale packaging; encapsulation; filled polymers; flip-chip devices; integrated circuit interconnections; integrated circuit metallisation; Cu; bump diameter; capillary underfill materials; copper damascene; flip chip bump pitch; flip chip gap height; flip chip packaging; highly filled epoxy resins; lead-free interconnections; low power consumption electronics; low profile packaging; low-k dielectrics; small form factor package; thin die structures; underfill processes; underfill technology; Adhesives; Flip chip; Materials science and technology; Packaging; Passivation; Predictive models; Silicon; Surface tension; Temperature; Viscosity;
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
DOI :
10.1109/ECTC.2004.1319333